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1 radiation induced latchup
фіксація під впливом радіації (в КМОН-структурі)English-Ukrainian dictionary of microelectronics > radiation induced latchup
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2 latchup
1) фіксація, замикання 2) порушення спрацьовування (під впливом паразитних ефектів)
См. также в других словарях:
Radiation hardening — is a method of designing and testing electronic components and systems to make them resistant to damage or malfunctions caused by ionizing radiation (particle radiation and high energy electromagnetic radiation),[1] such as would be encountered… … Wikipedia
MIL-STD-883 — The MIL STD 883 standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental tests to determine resistance to… … Wikipedia
Single event upset — A single event upset (SEU) is a change of state caused by a low energy ions or electro magnetic or nuclear radiation interferences strike to a sensitive node in a micro electronic device, such as in a microprocessor, semiconductor memory, or… … Wikipedia
Phase-change memory — Computer memory types Volatile RAM DRAM (e.g., DDR SDRAM) SRAM In development T RAM Z RAM TTRAM Historical Delay line memory Selectron tube Williams tube Non volatile … Wikipedia
